Rietveld analysis refers to
Detailed information such as atomic arrangements within the crystal can be obtained from the analysis of measurement data like XRD.
Rietveld analysis is a method for analyzing measurement data from XRD (X-ray diffraction) and neutron diffraction. In addition to identifying lattice constants and space groups using existing methods, it is possible to obtain more detailed crystallographic information, such as atomic arrangements within the unit cell, if there is a crystal structure model (candidate) for the sample.
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